Reduction of Leakage Power using Stacking Power Gating Technique in Different CMOS Design Style at 45Nanometer Regime

Reduction of Leakage Power using Stacking Power Gating Technique in Different CMOS Design Style at 45Nanometer Regime

As transistor sizes scale down and levels of integration increase, leakage power has become a vital downside in modern low-power VLSI technology. This is often very true for ultra-lowvoltage (ULV) circuits, wherever high levels of leakage force designers to selected relatively high threshold voltages, which limits performance. In this paper, we design different design approach of master slave D...

Reduction of Leakage Power in Digital Logic Circuits Using Stacking Technique in 45 Nanometer Regime

Power dissipation due to leakage current in the digital circuits is a biggest factor which is considered specially while designing nanoscale circuits. This paper is exploring the ideas of reducing leakage current in static CMOS circuits by stacking the transistors in increasing numbers. Clearly it means that the stacking of OFF transistors in large numbers result a significant reduction in powe...

Leakage Power Reduction Through Hybrid Multi-Threshold CMOS Stack Technique In Power Gating Switch

In this paper Two Hybrid digital circuit design techniques are produced as Hybrid MultiThreshold CMOS complete stack technique and Hybrid Multi-Threshold CMOS partial stack technique for reducing the leakage power dissipation in mode transistion.Tri-modal switch are performance depends on these two techniques reduce the leakage power dissipation. These technique are implemented in the CADENCE v...

Leakage Power Reduction in CMOS

The advantage of scaling devices is to achieve high performance, low power, large integration and low cost continues to be attractive to the semiconductor industries. However, increasing variability in the device characteristics, soft errors and device degradation in CMOS technologies pose major challenges in the future scaling. Variation in process, voltage and temperature cause uncertainty in...

Reduction of Leakage Current in Six Stage Charge Pump Using Stacking Power Gating Technology